Goddard Engineering and Technology Directorate

Cryogenic, High-Accuracy Refraction Measuring System (CHARMS)

This image shows Dr. Manuel Quijada and Goddard’s Cryogenic, High-Accuracy Refraction Measuring System (CHARMS).
This image shows Dr. Manuel Quijada and Goddard’s Cryogenic, High-Accuracy Refraction Measuring System (CHARMS).

Advanced Refractometry for Space and Ground-Based Instrumentation

CHARMS uses the method of minimum deviation refractometry to measure the index of refraction of transmissive materials in vacuum from ultraviolet to infrared wavelengths from ambient to cryogenic temperatures.  Originally developed to support instrument design for the James Webb Space Telescope, CHARMS has seen broad application to NASA and non-NASA missions since, including ground-based instruments.

The Cryogenic, High-Accuracy Refraction Measuring System (CHARMS) is managed by ETD’s
Instrument Systems and Technology Division (Code 550)